Pind

A PIND test is a Particle Impact Noise Detection test. According to method 2020.9 of MIL-STD-883 and method 2052.5 of MIL-STD-750, the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact within the cavity, excite the transducer.

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References

↑ "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5". Department of Defense. http://www.dscc.dla.mil/downloads/milspec/docs/mil-std-883/std883.pdf. Retrieved 17 December 2015.
↑ "TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F". Department of Defense. http://www.landandmaritime.dla.mil/Downloads/MilSpec/Docs/MIL-STD-750/std750part2.pdf.

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[1] "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5". Department of Defense. http://www.dscc.dla.mil/downloads/milspec/docs/mil-std-883/std883.pdf. Retrieved 17 December 2015.

[2] "TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F". Department of Defense. http://www.landandmaritime.dla.mil/Downloads/MilSpec/Docs/MIL-STD-750/std750part2.pdf.