Photon-Induced Near-field Electron Microscopy

Short description: Electron microscope technique

Photon-Induced Near-field Electron Microscopy (PINEM) is a variant of the Ultrafast Transmission Electron Microscopy technique and is based on the inelastic coupling between electrons and photons in presence of a surface or a nanostructure.[1] This method allows one to investigate time-varying nanoscale electromagnetic fields in an electron microscope.[2][3]

For visible light, such inelastic coupling between electrons and light, i.e. direct absorption or emission of photons, is forbidden in free space (vacuum) since it is not possible to simultaneously conserve both energy and momentum. This constraint can be circumvented when photon momentum is broadened as a result of light being reflected or scattered from a surface or nanostructure. This process would then generate evanescently confined near-fields with a broad momentum distribution, reaching high intensities in a nanoconfined space and thus also boosting the cross section of electron-light coupling.

Theoretically, the analytical description of the phenomenon has been provided by Park et al.,[4] Garcia de Abajo et al.[5] and Feist et al.[6] In these works the authors demonstrated that the strength of electron-light interaction depends on the linear coupling to the electric field projection along the electron propagation direction. In particular, Feist et al.[6] also experimentally demonstrated that the interaction process results in a coherent spectral redistribution of the electron wave packet producing Rabi oscillations of a multi-level quantum ladder in which the states are separated by the photon energy.

For photonics application is the fact that the spectral, spatial and momentum distributions of the electrons subjected to such inelastic scattering process are strictly correlated with the near-field distribution mediating the electron-light coupling. The latter can be thus mapped in space and time with ultrafast electron microscopy methods, providing femtosecond movies of nanoscale fields in and around nanostructures.[7][8][9]

The PINEM method can also be used to dynamically manipulate the wave properties of the electron beam by using suitably prepared electromagnetic field configuration. In such a way, one can modulate coherently the amplitude and phase of the electron beam along both the longitudinal and the transverse directions.[6][10][11][12][13][14][15]

## See also

* Transmission electron microscopy
* Electron energy loss spectroscopy (EELS)
* Energy filtered transmission electron microscopy (EFTEM)

## References

1. ↑ Barwick, Brett; Flannigan, David J.; Zewail, Ahmed H. (December 2009). "Photon-induced near-field electron microscopy". Nature 462 (7275): 902–906. doi:10.1038/nature08662. ISSN 0028-0836. PMID 20016598. Bibcode: 2009Natur.462..902B. https://authors.library.caltech.edu/42870/.
2. ↑ Piazza, L; Lummen, T.T.A.; Quiñonez, E; Murooka, Y; Reed, B.W.; Barwick, B; Carbone, F (2 March 2015). "Simultaneous observation of the quantization and the interference pattern of a plasmonic near-field". Nature Communications 6 (1): 6407. doi:10.1038/ncomms7407. PMID 25728197. Bibcode: 2015NatCo...6.6407P.
3. ↑ Barwick, Brett; Zewail, Ahmed H. (2015-10-21). "Photonics and Plasmonics in 4D Ultrafast Electron Microscopy" (in en). ACS Photonics 2 (10): 1391–1402. doi:10.1021/acsphotonics.5b00427. ISSN 2330-4022.
4. ↑ S. T. Park; M. Lin; A. H. Zewail (December 2010). "Photon-induced near-field electron microscopy (PINEM): theoretical and experimental". New Journal of Physics 12 (12). doi:10.1088/1367-2630/12/12/123028. Bibcode: 2010NJPh...12l3028P.
5. ↑ F. J. García de Abajo; A. Asenjo-Garcia; M. Kociak (April 2010). "Multiphoton Absorption and Emission by Interaction of Swift Electrons with Evanescent Light Fields". Nano Letters 10 (5): 1859–1863. doi:10.1021/nl100613s. PMID 20415459. Bibcode: 2010NanoL..10.1859G. https://pubs.acs.org/doi/full/10.1021/nl100613s.
6. ↑ 6.0 6.1 6.2 A. Feist; K. E. Echternkamp; J. Schauss; S. V. Yalunin; S. Schäfer; C. Ropers (May 2015). "Quantum coherent optical phase modulation in an ultrafast transmission electron microscope". Nature 521 (7551): 200–203. doi:10.1038/nature14463. PMID 25971512. Bibcode: 2015Natur.521..200F. https://www.nature.com/articles/nature14463.
7. ↑ I. Madan; G. M. Vanacore; E. Pomarico; G. Berruto; R. J. Lamb; D. McGrouther; T. T. A. Lummen; T. Latychevskaia et al. (May 2019). "Holographic imaging of electromagnetic fields via electron-light quantum interference". Science Advances 5 (5). doi:10.1126/sciadv.aav8358. PMID 31058225. Bibcode: 2019SciA....5.8358M.
8. ↑ Wang, Kangpeng; Dahan, Raphael; Shentcis, Michael; Kauffmann, Yaron; Ben Hayun, Adi; Reinhardt, Ori; Tsesses, Shai; Kaminer, Ido (2020-06-04). "Coherent interaction between free electrons and a photonic cavity" (in en). Nature 582 (7810): 50–54. doi:10.1038/s41586-020-2321-x. ISSN 0028-0836. PMID 32494081. Bibcode: 2020Natur.582...50W. http://www.nature.com/articles/s41586-020-2321-x.
9. ↑ Kfir, Ofer; Lourenço-Martins, Hugo; Storeck, Gero; Sivis, Murat; Harvey, Tyler R.; Kippenberg, Tobias J.; Feist, Armin; Ropers, Claus (2020-06-04). "Controlling free electrons with optical whispering-gallery modes" (in en). Nature 582 (7810): 46–49. doi:10.1038/s41586-020-2320-y. ISSN 0028-0836. PMID 32494079. Bibcode: 2020Natur.582...46K. http://www.nature.com/articles/s41586-020-2320-y.
10. ↑ Morimoto, Yuya; Baum, Peter (27 November 2017). "Diffraction and microscopy with attosecond electron pulse trains". Nature Physics 14 (3): 252–256. doi:10.1038/s41567-017-0007-6. ISSN 1745-2473. http://nbn-resolving.de/urn:nbn:de:bsz:352-2-ct2lzpyprxx10.
11. ↑ Kozák, M.; Eckstein, T.; Schönenberger, N.; Hommelhoff, P. (9 October 2017). "Inelastic ponderomotive scattering of electrons at a high-intensity optical travelling wave in vacuum". Nature Physics 14 (2): 121–125. doi:10.1038/nphys4282. ISSN 1745-2473.
12. ↑ Priebe, Katharina E.; Rathje, Christopher; Yalunin, Sergey V.; Hohage, Thorsten; Feist, Armin; Schäfer, Sascha; Ropers, Claus (December 2017). "Attosecond electron pulse trains and quantum state reconstruction in ultrafast transmission electron microscopy" (in en). Nature Photonics 11 (12): 793–797. doi:10.1038/s41566-017-0045-8. ISSN 1749-4885. Bibcode: 2017NaPho..11..793P. http://www.nature.com/articles/s41566-017-0045-8.
13. ↑ Vanacore, G. M.; Madan, I.; Berruto, G.; Wang, K.; Pomarico, E.; Lamb, R. J.; McGrouther, D.; Kaminer, I. et al. (12 July 2018). "Attosecond coherent control of free-electron wave functions using semi-infinite light fields". Nature Communications 9 (1): 2694. doi:10.1038/s41467-018-05021-x. PMID 30002367. Bibcode: 2018NatCo...9.2694V.
14. ↑ K. E. Echternkamp; A. Feist; S. Schäfer; C. Ropers (August 2016). "Ramsey-type phase control of free-electron beams". Nature Physics 12 (11): 1000–1004. doi:10.1038/NPHYS3844. Bibcode: 2016NatPh..12.1000E. https://www.nature.com/articles/nphys3844.
15. ↑ G. M. Vanacore; G. Berruto; I. Madan; E. Pomarico; P. Biagioni; R. J. Lamb; D. McGrouther; O. Reinhardt et al. (May 2019). "Ultrafast generation and control of an electron vortex beam via chiral plasmonic near fields". Nature Materials 18 (6): 573–579. doi:10.1038/s41563-019-0336-1. PMID 31061485. Bibcode: 2019NatMa..18..573V. https://www.nature.com/articles/s41563-019-0336-1.

* v
* t
* e

Electron microscopy

Basics|

* Electron microscope
* History
* Micrograph
* Microscope
* Timeline of microscope technology

Electron interaction
with matter|

* Auger effect
* Bremsstrahlung
* Electron diffraction
* Electron scattering
* Kikuchi lines
* Secondary electrons
* X-ray fluorescence

Instrumentation|

* Detectors for transmission electron microscopy
* Electron gun
* Everhart–Thornley detector
* Field electron emission
* Field emission gun
* Magnetic lens
* Stigmator

Microscopes|

| EM|

* Cryo-EM
* EPMA
* Liquid-Phase EM
* Low-energy EM
* Photoemission EM

|

SEM|

* Environmental SEM
* CryoSEM
* Confocal SEM
* SEM-XRF

TEM|

* Cryo-TEM
* Cryo-ET
* EFTEM
* HRTEM
* STEM
* 4D STEM
* Aberration-Corrected TEM

Techniques|

* 4D STEM
* Annular dark-field imaging
* Cathodoluminescence
* Charge contrast imaging
* CBED
* cryoEM
* Dark-field microscopy
* EDS
* EBSD
* TKD
* ECCI
* EELS
* EBIC
* Electron holography
* Electron tomography
* FIB
* FEM
* Immune electron microscopy
* Geometric phase analysis
* PINEM
* Precession electron diffraction
* Serial block-face scanning electron microscopy
* WDXS
* WBDF

Others|

| Developers|

* Albert Crewe
* Bodo von Borries
* Dennis Gabor
* Ernst G. Bauer
* Ernst Ruska
* Gerasimos Danilatos
* Harald Rose
* James Hillier
* Manfred von Ardenne
* Max Knoll
* Maximilian Haider
* Nestor J. Zaluzec
* Ondrej Krivanek
* Thomas Eugene Everhart
* Vernon Ellis Cosslett
* Vladimir K. Zworykin

|

Manufacturers|

* FEI Company
* Hitachi High-Technologies
* JEOL
* Leica
* Nion Company
* TESCAN
* Thermo Fisher Scientific
* Zeiss

Software|

* CASINO
* CrysTBox
* EM Data Bank
* EMsoft
* Digital Micrograph
* Direct methods
* IUCr
* MTEX
* Multislice

* Category
* Commons

0.00

(0 votes)

Original source: https://en.wikipedia.org/wiki/Photon-Induced Near-field Electron Microscopy. Read more

|

Retrieved from "https://handwiki.org/wiki/index.php?title=Photon-Induced_Near-field_Electron_Microscopy&oldid=4333243"
*[v]: View this template
*[t]: Discuss this template
*[e]: Edit this template