Scanning gate microscopy

Scanning gate microscopy (SGM) is a scanning probe microscopy technique with an electrically conductive tip used as a movable gate that couples capacitively to the sample and probes electrical transport on the nanometer scale.[1][2] Typical samples are mesoscopic devices, often based on semiconductor heterostructures, such as quantum point contacts or quantum dots. Carbon nanotubes too have been investigated.

## Operating principle

In SGM one measures the sample's electrical conductance as a function of tip position and tip potential. This is in contrast to other microscopy techniques where the tip is used as a sensor, e.g., for forces.

## Development

SGMs were developed in the late 1990s from atomic force microscopes. Most importantly, these had to be adapted for use at low temperatures, often 4 kelvins or less, as the samples under study do not work at higher temperatures. Today an estimated number of eleven research groups worldwide use the technique.

## References

1. ↑ Sellier, H; Hackens, B; Pala, M G; Martins, F; Baltazar, S; Wallart, X; Desplanque, L; Bayot, V et al. (2011). "On the imaging of electron transport in semiconductor quantum structures by scanning-gate microscopy: successes and limitations". Semiconductor Science and Technology 26 (6): 064008. doi:10.1088/0268-1242/26/6/064008. ISSN 0268-1242. Bibcode: 2011SeScT..26f4008S.
2. ↑ Gorini, Cosimo; Jalabert, Rodolfo A.; Szewc, Wojciech; Tomsovic, Steven; Weinmann, Dietmar (2013). "Theory of scanning gate microscopy". Physical Review B 88 (3). doi:10.1103/PhysRevB.88.035406. ISSN 1098-0121. Bibcode: 2013PhRvB..88c5406G.

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Scanning probe microscopy

Common|

* Atomic force
* Conductive
* Infrared
* Non-contact
* Photoconductive
* Scanning tunneling
* Electrochemical
* Spin polarized

Typical atomic force microscopy set-up

Other|

* Ballistic electron emission
* Chemical force
* Electrostatic force
* Kelvin probe force
* Magnetic force
* Magnetic resonance force
* Near-field scanning optical
* Nano-FTIR
* Photon scanning
* Photothermal microspectroscopy
* Piezoresponse force
* Scanning capacitance
* Scanning electrochemical
* Scanning gate
* Scanning Hall probe
* Scanning ion-conductance
* Scanning joule expansion
* Scanning Kelvin Probe
* Scanning SQUID microscope
* Scanning SQUID microscopy
* Scanning thermal
* Scanning voltage

Applications|

* Scanning probe lithography
* Dip-pen nanolithography
* Feature-oriented scanning
* Millipede memory

See also|

* Nanotechnology
* Microscope
* Microscopy
* Vibrational analysis

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