International Centre for Diffraction Data

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The International Centre for Diffraction Data (ICDD) maintains a database of powder diffraction patterns, the Powder Diffraction File (PDF), including the d-spacings (related to angle of diffraction) and relative intensities of observable diffraction peaks. Patterns may be experimentally determined, or computed based on crystal structure and Bragg's law. It is most often used to identify substances based on x-ray diffraction data, and is designed for use with a diffractometer. The PDF contains more than a million unique material data sets. Each data set contains diffraction, crystallographic and bibliographic data, as well as experimental, instrument and sampling conditions, and select physical properties in a common standardized format.

The organization was founded in 1969 as the Joint Committee on Powder Diffraction Standards. In 1978, the name was changed to International Centre for Diffraction Data to better encompass the global commitment of the endeavor.[1]

The ICDD is a nonprofit scientific organization working in the field of X-ray analysis and materials characterization. It produces materials databases, characterization tools, and educational materials, as well as organizing and supporting global workshops, clinics and conferences.[1]

Products and services of the ICDD include the paid subscription based Powder Diffraction File databases (PDF-2, PDF-4+, PDF-4+/Web , PDF-4/Minerals, PDF-4/Organics, PDF-4/Axiom, and ICDD Server Edition), educational workshops, clinics, and symposia. It is a sponsor of the Denver X-ray Conference and the Pharmaceutical Powder X-ray Diffraction Symposium. It also publishes the journals Advances in X-ray Analysis and Powder Diffraction.

In 2019, Materials Data, also known as MDI, merged with ICDD. Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects.

In 2020, the ICDD and the Cambridge Crystallographic Data Centre, which curates and maintains the Cambridge Structural Database, announced a data partnership.

## See also

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* Powder diffraction
* Crystallography

## References

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1. ^ a b "History of ICDD -". 2017-10-11. Retrieved 2025-06-20.

## External links

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* International Centre for Diffraction Data official website
* History, contents & use of the PDF
* Materials Data
* Advances in X-ray Analysis—Technical articles on x-ray methods and analyses
* Powder Diffraction Journal—quarterly journal published by the JCPDS-International Centre for Diffraction Data through the Cambridge University Press
* Denver X-ray Conference—World's largest X-ray conference on the latest advancements in XRD and XRF
* PPXRD-16 —Pharmaceutical Powder X-ray Diffraction Symposium

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Crystallography

Key concepts|

* Timeline of crystallography
* Crystallographers
* Metallurgy
* Biocrystallography

| Structure|

* Unit cell
* Bravais lattice
* Miller index
* Point group
* Reciprocal lattice
* Restriction theorem
* Periodic table
* Structure prediction

| Systems|

* Cubic
* Hexagonal
* Monoclinic
* Orthorhombic
* Tetragonal
* Triclinic

|

* Growth
* Crystallite
* Equiaxed
* Twinning
* Fiveling
* Aperiodic crystal
* Quasicrystal

Phase
transition|

* Phase diagram
* Eutectic
* Miscibility gap
* Polymorphism
* Liquid crystal
* Phase transformation crystallography
* Precipitation
* Segregation
* Spinodal decomposition
* Supersaturation
* GP-zone
* Ostwald ripening

Defects|

| Grain boundary|

* Disclination
* CSL
* Growth
* Abnormal growth

|

* Perfect crystal
* Stacking fault
* Dislocation
* Burgers vector
* Partial dislocation
* Kink
* Cross slip
* Frank–Read source
* Cottrell atmosphere
* Peierls stress
* GND
* Lomer–Cottrell junction
* Slip
* Slip bands
* Interstitials
* Bjerrum defect
* Frenkel defect
* Wigner effect
* Vacancy
* Schottky defect
* F-center
* Stone–Wales defect
* Defects in diamond

Laws|

* Bragg's law
* Friedel's law
* Steno's law (constancy of interfacial angles)
* Law of rational indices
* Law of symmetry

* Bragg plane
* Ewald's sphere
* Hermann–Mauguin notation
* Structure factor
* Thermal ellipsoid

Characterisation|

* Electron
* Diffraction
* Scattering
* Neutron
* Diffraction
* Scattering
* Nuclear magnetic resonance
* X-ray
* Diffraction
* Scattering

Algorithms|

* Direct methods
* Isomorphous replacement
* Molecular replacement
* Molecular dynamics
* Patterson map
* Phase retrieval
* Gerchberg–Saxton
* Single particle analysis

Software|

* CCP4
* Coot
* CrystalExplorer
* DSR
* JANA2020
* MTEX
* OctaDist
* Olex2
* SHELX

Databases|

* Bilbao Crystallographic Server
* CCDC
* CIF
* COD
* ICSD
* ICDD
* PDB

Journals|

* Crystal Growth & Design
* Crystallography Reviews
* Journal of Chemical Crystallography
* Journal of Crystal Growth
* Kristallografija
* Zeitschrift für Kristallographie – Crystalline Materials
* Zeitschrift für Kristallographie – New Crystal Structures

Awards|

* Carl Hermann Medal
* Ewald Prize
* Gregori Aminoff Prize

History|

* Chemical crystallography before X-rays
* Physical crystallography before X-rays
* Timeline of crystallography

Organisation|

* IUCr
* IOBCr
* RAS
* DMG

| Associations|

* Europe
* France
* Germany
* UK
* US
* Japan

|

* Category
* Commons

Authority control databases

International|

* ISNI
* VIAF

National|

* United States
* Israel

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