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JEOL

Topic: Company

 From HandWiki - Reading time: 6 min
Short description: Japanese manufacturer of scientific instruments
JEOL Ltd.
Native name
日本電子株式会社
TypePublic KK
TYO: 6951
ISIN[https://handwiki.org/wiki/index.php?title=Toollabs:isin/&language=en&isin=JP3735000006 JP3735000006]
IndustryPrecision instrument
FoundedMay 30, 1949; 75 years ago (1949-05-30)
FoundersKenji Kazato
Kazuo Ito
Headquarters
Akishima, Tokyo 196-8558
,
Japan
Area served
Worldwide
Key people
Gon-emon Kurihara
(President)
Products
RevenueIncrease JPY 107.3 billion (FY 2015) (US$ 952 million) (FY 2015)
Increase JPY 4 billion (FY 2015) (US$ 36.2 million) (FY 2015)
Number of employees
2,963 (consolidated as of March 31, 2016)
Websitewww.jeol.co.jp/en/
Footnotes / references
[1][2]

JEOL, Ltd. (日本電子, Nihon Denshi Kabushiki-kaisha, Nihon meaning Japan and Denshi meaning electron) is a major developer and manufacturer of electron microscopes and other scientific instruments, industrial equipment and medical equipment.[3]

Its headquarters are in Tokyo, Japan , with 25 domestic and foreign subsidiaries and associated companies as of 2014.[3] It is listed in the top ten businesses worldwide for analytical laboratory instrument manufacturing.[4] JEOL's instruments are used by researchers around the world, including the University of Cambridge,[5] University of Oxford,[6] and MIT.[7]

It has been included in the Activest Lux Nanotech Mutual Fund[8] and the WestLB Nanotech Fund.[9]

History

Scientists in Japan began to collaborate as early as 1939 on the development of an electron microscope. Kenji Kazato and Kazuo Ito met while working at the Naval Central Institute in Tokyo during World War II. After the war, Kazato attracted Ito and a group of others to Mobara, Chiba Prefecture, Japan.[10][11] This initial group developed a prototype magnetic field–type electron microscope called the DA-1, which was sold to Mitsubishi in 1947.[12][13] Because of differences over the direction of this early company, Kazato and Ito chose to found a new organization.[10]

The Japan Electron Optics Laboratory Company, Limited (Nihon Denshi Kogaku Kenkyujo)[13] was founded in 1949 by Kenji Kazato and Kazuo Ito in Mitaka, Tokyo.[12][14] It produced its first commercial model transmission electron microscope, the JEM-1,[12] a year later. Overseas sales began in 1956 with the sale of a system to France. The company's strengths were the customization of orders to fit customer requests, and the provision of strong customer support.[10]

In 1961, the company was renamed JEOL, Limited. Its first overseas subsidiary, JEOL Company (USA) Inc., was established in 1962 and headquartered in Peabody, MA. JEOL was listed on the Second Section of the Tokyo Stock Exchange by 1962, and on the First Section of the Tokyo Stock Exchange by 1966.[12]

The company expanded from electron microscopy to nuclear magnetic resonance (NMR), releasing the first NMR system in Japan, the JNM-1, in 1956. They produced their first mass spectrometer in 1963, and their first scanning electron microscope in 1966. In 1968, they produced the first amino acid analyzer in the world, the JLC-5AH.[12] The company also continued to develop its line of electron microscopes. The JEM-7, in 1964, was the first electronic microscope to include a mechanism for the electrical adjustment of the lens axis. The JEM-100B incorporated an electromagnetic deflection unit as well as an electromagnetic stigmator. The first photomicrograph of atomic arrangement in the world was taken by a JEOL electron microscope, in 1976.[12]

Kazuo Ito has expressed the company's philosophy as follows:

"On the basis of creativity, and research and development, JEOL (日本電子) positively challenges the world’s highest technology thus forever contributing to the progress in both science and human society through its products."[10]

In commemoration of JEOL's 20th anniversary, the Kazato Research Foundation was created to support electron microscopy research.[15] Kenji Kazato retired as president of JEOL in 1975, but continued to act as an adviser to the company until his death in 2012. Kazuo Ito was JEOL's president from 1982 to 1987. The Pittcon Heritage Award was posthumously awarded to them in 2016 for their contributions to scientific instrumentation.[12][16] In 2014, a STEM resolution of 45 pm with a 300 kV microscope was first demonstrated with the atomic transmission electron microscope JEM-AMM300F.[17][18]

Operations

JEOL Ltd. has four business segments. Electron Optics manufactures scanning electron microscopes, transmission electron microscopes and scanning probe microscopes, along with related equipment. The Analytical Instruments section's products include mass spectrometers, nuclear magnetic resonance and electron spin resonance equipment. The Industrial Equipment segment covers a range of equipment particularly targeted at the semiconductor industry, such as electron beam sources, wafer process monitors, and plasma gun series. Finally, the Medical Equipment segment manufactures automatic analysis devices, clinical diagnostic systems and amino acid analyzers.[citation needed]

Products

  • The JEOL AccuTOF JMS T100LC mass spectrometer won a bronze award at the 2002 Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy[19]
  • The DART ion source won a Pittcon Editors' Gold Award at the 2005 Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy[20][21]
  • maskless lithograph ML2 type, JBX-8100FS, based on patented ZrO/W (Schottky) emitter.

In popular culture

The company's direct analysis in real time (DART) mass spectrometry system has appeared on the television program CSI: NY.[22][23]

The JEOL transmission electron microscope JEM 1011 was a base platform for Prometheus (2012 film) science lab microscope.[24]

See also

  • Laboratory equipment

References

  1. ↑ "Company Outline". JEOL. https://www.jeol.co.jp/en/corporate/outline/about.html. 
  2. ↑ "Company Profile". Nikkei Asian Review. Nikkei Inc.. http://asia.nikkei.com/Company/05HZRF-E. 
  3. ↑ 3.0 3.1 "Annual Report 2014". http://www.jeol.co.jp/en/corporate/ir/download/annualreport/global_complete_annualreport_2014.pdf. 
  4. ↑ "JEOL LTD". http://www.plunkettresearch.com/company-profile/jeol-ltd/. 
  5. ↑ "Facilities @ Wolfson Electron Microscopy Suite". http://www-hrem.msm.cam.ac.uk/facilities/index.shtml. 
  6. ↑ "Instruments". David Cockayne Centre for Electron Microscopy David Cockayne Centre for Electron Microscopy. https://www-em.materials.ox.ac.uk/instruments-table. 
  7. ↑ "Electron Microscopy". MIT Center for Materials Science and Engineering. http://web.mit.edu/cmse/facilities/electron.shtml. 
  8. ↑ Uldrich, Jack (2006). Investing in nanotechnology : profiles over 100 leading nanotechnology companies. Avon, MA: Adams Media. p. 45. ISBN 9781593374082. https://archive.org/details/investinginnanot00uldr. Retrieved 24 June 2016. 
  9. ↑ Thayer, Ann M. (May 2, 2005). "Nanotech Investing". Chemical & Engineering News 83 (18): 17–24. doi:10.1021/cen-v083n018.p017. http://pubs.acs.org/email/cen/html050205090343.html. Retrieved 24 June 2016. 
  10. ↑ 10.0 10.1 10.2 10.3 Aspray, William (May 16, 1994). "KENJI KAZATO & KAZUO ITO: An Interview Conducted by William Aspray (Interview #199)". Center for the History of Electrical Engineering, The Institute of Electrical and Electronics Engineers, Inc.. http://ethw.org/Oral-History:Kenji_Kazato_and_Kazuo_Ito. 
  11. ↑ Yoshimura, Nagamitsu (2013). Historical evolution toward achieving ultrahigh vacuum in JEOL electron microscopes. Tokyo: Springer Japan. ISBN 978-4431544487. https://books.google.com/books?id=_a_BAAAAQBAJ&pg=PA11. Retrieved 29 June 2016. 
  12. ↑ 12.0 12.1 12.2 12.3 12.4 12.5 12.6 "Pittcon Heritage Award". http://www.chemheritage.org/visit/events/awards/affiliate-partnership-awards/pittcon-heritage-award.aspx. 
  13. ↑ 13.0 13.1 Ito, Kazuo (1996). "Development of the Electron Microscope at JEOL". The growth of electron microscopy. San Diego: Academic Press. pp. 659–664. ISBN 9780120147380. https://books.google.com/books?id=o-IFp53_1-IC&pg=PA661. Retrieved 29 June 2016. 
  14. ↑ Palucka, Tim. "Overview of Electron Microscopy". http://authors.library.caltech.edu/5456/1/hrst.mit.edu/hrs/materials/public/ElectronMicroscope/EM_HistOverview.htm. 
  15. ↑ "Objectives / Brief History". http://www.kazato.org/english/foundation.html. 
  16. ↑ "Award Presentations at PITTCON 2016". http://pittcon.org/2016/Pittcon_Final-Program-2016.pdf. 
  17. ↑ "Error: no |title= specified when using {{Cite web}}". https://academic.oup.com/jmicro/article/64/3/213/1989533. 
  18. ↑ Krivanek, O.L.; Lovejoy, T.C.; Dellby, N. (September 2015). "Aberration-corrected STEM for atomic-resolution imaging and analysis: ABERRATION-CORRECTED STEM" (in en). Journal of Microscopy 259 (3): 165–172. doi:10.1111/jmi.12254. PMID 25939916. https://onlinelibrary.wiley.com/doi/10.1111/jmi.12254. 
  19. ↑ Sparkman, O. David (June 2002). "Mass Spectrometry PittCon®2002". Journal of the American Society for Mass Spectrometry 13 (6): 749–758. doi:10.1016/S1044-0305(02)00394-X. 
  20. ↑ Borman, Stu (March 28, 2005). "Pittcon 2005 Takes Orlando by Storm". Chemical & Engineering News 83 (13): 39–45. doi:10.1021/cen-v083n013.p039. http://pubs.acs.org/cen/coverstory/83/print/8313pittcon.html. Retrieved 29 June 2016. 
  21. ↑ Cody, Robert B.; Laramée, James A.; Durst, H. Dupont (April 2005). "Versatile New Ion Source for the Analysis of Materials in Open Air under Ambient Conditions". Analytical Chemistry 77 (8): 2297–2302. doi:10.1021/ac050162j. PMID 15828760. https://figshare.com/articles/Versatile_New_Ion_Source_for_the_Analysis_of_Materials_in_Open_Air_under_Ambient_Conditions/3290839. 
  22. ↑ Dorneanu, Lucian (July 19, 2007). "The Newest Tool for Fighting Counterfeit Money - as Seen on "CSI: New York"". I &heart Softpedia. http://news.softpedia.com/news/The-Newest-Tool-for-Fighting-Counterfeit-Money-as-Seen-on-CSI-New-York-60414.shtml. 
  23. ↑ ""CSI: New York" Turns TV Spotlight on Technology in use at ECBC". 20 October 2005. http://www.ecbc.army.mil/pr/download/2005/1020_DARTCSI.pdf. 
  24. ↑ 15 Most Expensive Movie Props On Sale In 2015

External links

Template:Electron microscopy



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